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dc.contributor.authorOji, Obiorahen_US
dc.date.accessioned2008-09-17T23:35:14Z
dc.date.available2008-09-17T23:35:14Z
dc.date.issued2008-09-17T23:35:14Z
dc.date.submittedAugust 2008en_US
dc.identifier.otherDISS-2255en_US
dc.identifier.urihttp://hdl.handle.net/10106/1137
dc.description.abstractSemiconductor device model optimization is highly beneficial; it improves the accuracy with which we can predict the performance of real devices and whole circuits before they are fabricated. This helps save time and money in being able to predict undesirable circuit responses. Although, it proves to be very useful, it can become very time consuming. The goal of this thesis is to use readily available tools to enhance and automate the somewhat complex process of optimization and streamline it so that results can be analyzed quicker with the goal of generating VBIC models that accurately match the behavior of the real device.en_US
dc.description.sponsorshipCarter, Ronald L.en_US
dc.language.isoENen_US
dc.publisherElectrical Engineeringen_US
dc.titleAutomation Of Thermal Model Extraction And Optimizationen_US
dc.typeM.S.en_US
dc.contributor.committeeChairCarter, Ronald L.en_US
dc.degree.departmentElectrical Engineeringen_US
dc.degree.disciplineElectrical Engineeringen_US
dc.degree.grantorUniversity of Texas at Arlingtonen_US
dc.degree.levelmastersen_US
dc.degree.nameM.S.en_US
dc.identifier.externalLinkhttps://www.uta.edu/ra/real/editprofile.php?onlyview=1&pid=226
dc.identifier.externalLinkDescriptionLink to Research Profiles


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