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    • Direct current electrical characterization of ds-DNA in nanogap junctions 

      Iqbal, Samir M.; Balasundaram, G.; Bashir, R.; Bergstrom, D. E.; Ghosh, Subhasis (Copyright American Institute of Physics;Department of Electrical Engineering, 2005-04-05)
      Measurements of DNA conductivity, hybridization, and melting using electronic means can have wide applications in molecular electronics and biological sensors. We have fabricated nanogap break-junctions by electromigration ...