Thermal Enhancement Of Stacked Dies Using Thermal Vias
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Following Moore's law, the number of transistors on a die continues to rise and has recently exceeded a billion on high end processors. In light of the convergence of technology, power requirements is becoming a serious concern even on low density interconnect systems such as cellular phones and personal digital assistants. Also, in order to minimize foot prints, the recent trend in packaging is stacking. The stacking, however, creates challenges in cooling and especially if one is to include logic in the stack. The primary heat flow path for stacking is through the substrate and as the number of stacks increase, the cooling problem is amplified. Thermal vias are emerging as a viable technology for transferring heat and in effect creating a thermal short circuit from individual die to the substrate. This thesis focuses on enhancement of thermal vias in different stacked die architectures for flash semiconductor products. Three different die stacking architectures were drawn as follows: spacer stacked, rotated stacked and pyramid stacked die. Geometries were drawn by using Pro-Engineer Wildfire 2.0 as a Computer-Aided-Design tool and imported to Ansys Workbench 10.0, where meshed analysis was conducted. There are different number thermal vias every packaging. So, this thesis compares the junction temperature and heat flux as number of thermal vias.