Now showing items 1-2 of 2

    • Direct current electrical characterization of ds-DNA in nanogap junctions 

      Iqbal, Samir M.; Balasundaram, G.; Bashir, R.; Bergstrom, D. E.; Ghosh, Subhasis (Copyright American Institute of Physics;Department of Electrical Engineering, 2005-04-05)
      Measurements of DNA conductivity, hybridization, and melting using electronic means can have wide applications in molecular electronics and biological sensors. We have fabricated nanogap break-junctions by electromigration ...
    • Fabrication and characterization of solid-state nanopores using a field emission scanning electron microscope 

      Iqbal, Samir M.; Chang, H.; Bashir, R.; Stach, E. A.; King, A.H.; Zaluzec, N. J. (Copyright American Institute of Physics, 2006-03-08)
      The fabrication of solid-state nanopores using the electron beam of a transmission electron microscope (TEM) has been reported in the past. Here, we report a similar method to fabricate solid-state nanopores using the ...