Browsing by Author "Celik-butler, Zeynep"
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Identification and Characterization of Gate Oxide Defects Responsible for Low Frequency Noise in MOSFETs
Rouf, A. S. M. Shamsur (2019-11-25)The main objective of this work is to identify and characterize gate oxide defects that are present in submicron p-channel metal oxide semiconductor field effect transistors (pMOSFETs) and which are responsible for random ...