Browsing by Author "Driscoll, Jack"
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Depth-Resolved Defect Characterization of Multi-Layer Thin-Film Semiconductor Materials via Positron Annihilation Spectroscopy
Driscoll, Jack; 0009-0003-6387-9729 (2023-12-15)Positron annihilation spectroscopy has frequently been used to perform depth-resolved defect characterization. In this thesis, the application of UTA's advanced positron beam to conduct depth-resolved defect studies on ...