Browsing by Author "Kim, Jee Yong"
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Investigation On The Mechanism Of Interface Electromigration (EM) In Copper (Cu) Thin Films
Kim, Jee Yong (Materials Science & Engineering, 2007-08-23)This study concerns the mechanism of the interface electromigration (EM) in copper (Cu) thin films. While EM in Cu is one of the most concerned reliability failure phenomena in Cu interconnects used microelectronic devices, ...