Browsing Library by Author "Koymen, Ali"
Now showing items 1-3 of 3
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Depth-Resolved Defect Characterization of Multi-Layer Thin-Film Semiconductor Materials via Positron Annihilation Spectroscopy
Driscoll, Jack; 0009-0003-6387-9729 (2023-12-15)Positron annihilation spectroscopy has frequently been used to perform depth-resolved defect characterization. In this thesis, the application of UTA's advanced positron beam to conduct depth-resolved defect studies on ... -
Electronic and Magnetic Properties of Metal Doped Silicon-Carbide Fullerene-type Nanostructures
Alathlawi, Hussain Jabreel; 0000-0001-6003-1499 (2021-12-20)Silicon carbide (SiC) is a technologically significant material. A recent report on the abundance of C60 fullerenes in interstellar space, along with the presence of SiC precursors, sparked interest in potentially similar ... -
INVESTIGATION OF OPTICAL AND ELECTRICAL PROPERTIES OF NOBLE METAL AND SUPERCONDUCTING THIN FILMS AND DESIGN AND FABRICATION OF METAMATERIAL SOLAR ABSORBERS
Khichar, Vivek; 0000-0002-0261-452X (2023-05-12)An extensive study of light-matter interactions leading to the generation of photon drag voltage under surface plasmon resonance conditions in noble metal thin films was undertaken by performing a series of experimental ...