Browsing Library by Author "Rahman, Mohammad Shahriar"
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Reliability Of Advanced Dielectrics In Gate Oxide And Device Level Packaging In MEMS
Rahman, Mohammad Shahriar (Electrical Engineering, 2010-03-03)The focus of this work is to study the feasibility, reliability and applicability of advanced dielectrics in both Metal Oxide Semiconductor Field Effect Transistor (MOSFET) gate oxide and device level packaging for ...