Browsing Library by Subject "EM reliability"

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    • STUDY OF ALLOY EFFECT ON ELECTROMIGRATION IN SN SOLDER ALLOYS 

      Ni, Geng; 0009-0008-2320-2349 (2023-05-22)
      This dissertation presents experimental results about the alloy effect on the Electromigration (EM) of Sn in Sn-based binary and ternary alloys. By using cross-stripe configuration, the alloy effect on EM of Sn can be ...