Browsing PhD Dissertations - DO NOT EDIT by Author "Celik-Butler, Zeynep"
Now showing items 1-9 of 9
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1/f Noise In Hafnium Based High-k Gate Dielectric MOSFETS And A Review Of Modeling
Devireddy, Siva Prasad (Electrical Engineering, 2008-04-22)For next generation MOSFETs, the constant field scaling rule dictates a reduction in the gate oxide thickness among other parameters. Consequently, gate leakage current becomes a serious issue with very thin SiO2 that ... -
Electrostatic And Piezoelectric Micro Energy Harvesters For Environmental Vibrational Energy Scavenging
Li, Yi (Electrical Engineering, 2015)Nowadays wireless sensors are widely used in all kinds of fields such as biomedical, commercial and military. Micro energy harvesters converting the wasteful energy from environment into electricity enable the possibility ... -
Failure Assessment In Aerospace Systems Via Integrated Multi-functional Sensors
Gonenli, Ismail Erkin (Electrical Engineering, 2010-07-19)Integrated sensors fabricated on flexible substrates show lots of promise due to their ability to conform on non-planar surfaces. Potential applications could be smart-skin and wearable electronics which can be used on ... -
Investigation Of Degradation In Advanced Analog MOS Technologies
Mahmud, Md. Iqbal (Electrical Engineering, 2014-03-12)The focus of this work is to study the noise and degradation in advanced high and low voltage analog Metal Oxide Semiconductor Field Effect Transistors (MOSFET). Medium and high voltage transistors, especially lateral ... -
INVESTIGATION OF THE CHANNEL HOT CARRIER (CHC) STRESSING EFFECTS AND IDENTIFICATION OF THE STRESS-INDUCED OXIDE TRAPS LEADING TO RTS IN PMOSFETS
Ahmed, Tanvir (2020-11-12)Electrical stressing mechanisms are responsible for the generation of stress-induced gate SiO2 defects, in addition to the presence of process-induced oxide traps, in MOSFETs. Random telegraph signal (RTS) can be utilized ... -
Measurement And Modeling Of 1/f Noise In MOSFET Devices With High-κ Material As The Gate Dielectric
Morshed, Tanvir Hasan (Electrical Engineering, 2008-04-22)A new 1/f noise model has been developed for MOSFET devices with high-κ gate stack. To investigate the impacts of nitridation, MOSFETs with nitrided high-κ dielectric was used. These devices were provided by Texas Instruments, ... -
Nanostructured Surfaces Using Thermal Nanoimprint Lithography: Applications In Thin Membrane Technology, Piezoelectric Energy Harvesting And Tactile Pressure Sensing
Nabar, Bhargav Pradip (Electrical Engineering, 2014-03-12)Nanoimprint lighography (NIL) is emerging as a viable contender for fabrication of large-scale arrays of 5-500 nm features. The work presented in this dissertation aims to leverage the advantages of NIL for realization of ... -
NOVEL VIBRATIONAL ENERGY HARVESTERS UTILIZING PIEZOELECTRIC Li-DOPED ZnO NANOWIRES AND THE TRIBOELECTRIC EFFECT
Hamid, H M Ashfiqul (2020-06-24)Vibration sources are omnipresent everywhere in our regular lives including the automobiles, aircraft, human body motion, wind flow, and water waves. Vibrational energy harvesters are electromechanical systems that can ... -
Reliability Of Advanced Dielectrics In Gate Oxide And Device Level Packaging In MEMS
Rahman, Mohammad Shahriar (Electrical Engineering, 2010-03-03)The focus of this work is to study the feasibility, reliability and applicability of advanced dielectrics in both Metal Oxide Semiconductor Field Effect Transistor (MOSFET) gate oxide and device level packaging for ...