Now showing items 1-5 of 5

    • Comparison of Point Estimators of Normal Percentiles 

      Dyer, Danny D.; Hensley, Onas L.; Keating, Jerome P. (University of Texas at ArlingtonDepartment of Mathematics, 1977-08)
      **Please note that the full text is embargoed** ABSTRACT: There are available several point estimators of the percentiles of a normal distribution with both mean and variance unknown. Consequently, it would seam appropriate ...
    • Methodology for Testing Homogeneity of Variances 

      Dyer, Danny D.; Keating, Jerome P. (University of Texas at ArlingtonDepartment of Mathematics, 1979-02)
      **Please note that the full text is embargoed** ABSTRACT: Suppose random samples are drawn from each of n populations with unknown means and variances. Developing procedures to test the claim that the population variances ...
    • On the Determination of Critical Values for Bartlett's Test 

      Keating, Jerome P.; Dyer, Danny D. (University of Texas at ArlingtonDepartment of Mathematics, 1979-06)
      **Please note that the full text is embargoed** ABSTRACT: The exact critical values for Bartlett's test for homogeneity of variances based on equal sample sizes from several normal populations are tabulated. It is also ...
    • On the Relative Behavior Of Estimators of Reliability/Survivability 

      Dyer, Danny D.; Hensley, Onas L.; Keating, Jerome P. (University of Texas at ArlingtonDepartment of Mathematics, 1978-05)
      **Please note that the full text is embargoed** ABSTRACT: Based on a decomposition of mean absolute error, a twofold technique is introduced whereby a pairwise comparison of point estimators of reliability/survivability ...
    • Pitman-Closeness Efficiency of Estimators of Reliability with Application to the Exponent/Al Failure Model 

      Keating, Jerome P.; Dyer, Danny D. (University of Texas at ArlingtonDepartment of Mathematics, 1977-10)
      **Please note that the full text is embargoed** ABSTRACT: When there are available several point estimators of component or system reliability, it would be of interest to compare such estimators through some "closeness to ...