Browsing Theses and Dissertations(library) by Subject "Defect"
Now showing items 1-1 of 1
-
Depth-Resolved Defect Characterization of Multi-Layer Thin-Film Semiconductor Materials via Positron Annihilation Spectroscopy
(2023-12-15)Positron annihilation spectroscopy has frequently been used to perform depth-resolved defect characterization. In this thesis, the application of UTA's advanced positron beam to conduct depth-resolved defect studies on ...