A Survey of Techniques for Determining Lower Confidence Bounds on Series System Reliability Based on Subsystem Test Data

dc.contributor.author	Dyer, Danny D.	en
dc.date.accessioned	2010-05-26T18:30:37Z	en
dc.date.available	2010-05-26T18:30:37Z	en
dc.date.issued	1975-09	en
dc.identifier.uri	http://hdl.handle.net/10106/2184	en
dc.description.abstract	Please note that the full text is embargoed ABSTRACT: A problem of considerable interest and for which a great deal of research has been expended is that of determining lower confidence bounds on series system reliability based on subsystem failure data. With regard to the types of failure data taken on the subsystems, primary consideration is given to binomial (pass-fail) data, exponentially distributed time-to-fail data for both Type I censoring (fixed test times) and Type II censoring (fixed number of failures), or any mixture thereof. In this survey we shall examine optimum solutions whenever they exist, approximate optimum solutions, and nonoptimum solutions. Numerical examples are given to illustrate the theory.	en
dc.language.iso	en_US	en
dc.publisher	University of Texas at Arlington	en
dc.relation.ispartofseries	Technical Report;31	en
dc.subject	Series system	en
dc.subject	Subsystem failure	en
dc.subject	Binomial	en
dc.subject	Type I censoring	en
dc.subject	Type II censoring	en
dc.subject.lcsh	Mathematics Research	en
dc.title	A Survey of Techniques for Determining Lower Confidence Bounds on Series System Reliability Based on Subsystem Test Data	en
dc.type	Technical Report	en
dc.publisher.department	Department of Mathematics	en